Path delay fault testing of multiplexer-based shifters
نویسندگان
چکیده
منابع مشابه
A Probabilistic Model for Path Delay Fault Testing
Testing path delay faults (PDFs) in VLSI circuits is becoming an important issue as we enter the deep submicron age. However, it is difficult in general since the number of faults is normally very large and most faults are either hard to sensitize or are untestable. In this paper, we propose a probabilistic PDF model. We investigate probability functions for the wire and path delay size to mode...
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Approved: ____________________________________ Thesis Supervisor ____________________________________ Title and Department ____________________________________ Date COMPACTION MECHANISM TO REDUCE TEST PATTERN COUNTS AND SEGMENTED DELAY FAULT TESTING FOR PATH DELAY FAULTS
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ژورنال
عنوان ژورنال: International Journal of Electronics
سال: 2001
ISSN: 0020-7217,1362-3060
DOI: 10.1080/00207210110058139